Una plataforma de fuente pulsada de Er:Glass para sistemas ópticos OEM seleccionados.
Lumexis desarrolla fuentes láser compactas de vidrio de erbio pulsado para OEM telemetría, detección óptica, LiDAR e instrumentos científicos. La serie abarca energía de pulso de 40–500 µJ a 1535 nm, con ancho de pulso de 3–6 ns, frecuencia de repetición de 1–1000 Hz según el modelo, divergencia ≤10 o ≤15 mrad, fuente de alimentación <2 V y operación de −40 a +65°C.
Los valores de rendimiento son específicos del modelo. Confirme la especificación técnica específica del pedido, la interfaz y el dibujo de integración antes de la liberación del diseño.
Telemetría OEMLiDAR y teledetecciónDetección ópticaInstrumentos científicosUna plataforma de fuente pulsada de Er:Glass para sistemas ópticos OEM seleccionados.
Seis modelos de fuente proporcionan un rango de energía definido para compensaciones del sistema.
Salida de pulso corto especificada en toda la serie de modelos publicados.
Seleccionada por modelo: 1–10 Hz o 1000 Hz para la fuente de 40 µJ.
Divergencia dependiente del modelo que debe coincidir con la trayectoria óptica del sistema anfitrión.
Rango de temperatura de operación publicado; confirme la configuración final.
Gama completa de productos
Todos los modelos publicados se muestran a continuación. Comience con la energía de pulso requerida, la frecuencia de repetición, la divergencia del haz y el volumen de instalación disponible; luego verifique la interfaz eléctrica, el dibujo mecánico y la condición de prueba para el sistema previsto.
1535-LXER040
40 µJ a 1535 nm; repetición de 1000 Hz; ancho de pulso de 3–6 ns; divergencia ≤15 mrad.
1535-LXER100
100 µJ a 1535 nm; repetición de 1–10 Hz; ancho de pulso de 3–6 ns; divergencia ≤10 mrad.
1535-LXER200
200 µJ a 1535 nm; repetición de 1–10 Hz; ancho de pulso de 3–6 ns; divergencia ≤10 mrad.
1535-LXER300
300 µJ a 1535 nm; repetición de 1–10 Hz; ancho de pulso de 3–6 ns; divergencia ≤10 mrad.
1535-LXER400
400 µJ a 1535 nm; repetición de 1–10 Hz; ancho de pulso de 3–6 ns; divergencia ≤15 mrad.
1535-LXER500
500 µJ a 1535 nm; repetición de 1–10 Hz; ancho de pulso de 3–6 ns; divergencia ≤15 mrad.
Comparación de modelos
La tabla es una ayuda de selección, no un documento de liberación de integración. La interfaz, el envolvente mecánico y las condiciones de prueba se confirman en la especificación técnica específica del modelo.
| Modelo | Energía de pulso | Repetición | Ancho de pulso | Divergencia | Alimentación | Temperatura de operación | Peso |
|---|---|---|---|---|---|---|---|
| 1535-LXER040 | 40 µJ | 1000 Hz | 3–6 ns | ≤15 mrad | <2 V | −40 a +65°C | — |
| 1535-LXER100 | 100 µJ | 1–10 Hz | 3–6 ns | ≤10 mrad | <2 V | −40 a +65°C | 9 g |
| 1535-LXER200 | 200 µJ | 1–10 Hz | 3–6 ns | ≤10 mrad | <2 V | −40 a +65°C | 9 g |
| 1535-LXER300 | 300 µJ | 1–10 Hz | 3–6 ns | ≤10 mrad | <2 V | −40 a +65°C | 9 g |
| 1535-LXER400 | 400 µJ | 1–10 Hz | 3–6 ns | ≤15 mrad | <2 V | −40 a +65°C | 11 g |
| 1535-LXER500 | 500 µJ | 1–10 Hz | 3–6 ns | ≤15 mrad | <2 V | −40 a +65°C | 13 g |
Nota de especificación: 1535 nm wavelength, pulse energy, repetition rate, pulse width and divergence values are model-specific published values. “—” means the public source data does not list a value; request the relevant datasheet for the selected model.
Laser-source fundamentals
Energy is stored in the erbium-doped glass gain medium and released as a short optical pulse when the passive Q-switch changes the resonator loss. The resulting pulse energy, width, beam divergence and repetition rate are interdependent design parameters—not independent settings to optimise in isolation.
The active glass stores pump energy and provides the 1535 nm laser transition.
Supports compact pulsed operation without an externally driven Q-switch.
Output optics set the delivered beam geometry for the host optical path.
Mounting, connector and aperture details must follow the selected model drawing.
Selection knowledge
A source should be evaluated as part of the complete optical and electrical system. These inputs help define the initial model shortlist and the engineering questions for sample testing.
Pulse energy sets the optical energy available per emission. Select it against required system signal margin, receiver sensitivity, optical losses and the final safety assessment.
Divergence controls how rapidly the beam expands. A host expander, aperture and alignment tolerance all influence the delivered footprint.
Repetition rate must match acquisition timing, thermal budget and host processing. The 40 µJ model is specified at 1000 Hz; other listed models are 1–10 Hz.
Shorter pulses can support time-of-flight resolution, but the full system response also includes detector, electronics, timing and signal-processing limits.
For small angles, use full-angle divergence θ in radians and propagation distance R. Include the source’s initial beam diameter, host optics and alignment tolerance in the detailed model. Confirm the divergence definition in the selected model’s specification.
Application solutions
Application fit depends on pulse energy, divergence, repetition rate, the host optical path and receiver architecture. Representative system testing is recommended before design release.
Pulsed-source building block for compact ranging instruments and integrated measurement subsystems.
Source integration for civil mapping systems that combine pulsed transmission, timing, scanning and receiver architecture.
Supports optical measurement workflows for railway and fixed infrastructure inspection equipment.
A compact 1535 nm pulsed source option for laboratory and field research instrumentation.
Mechanical & electrical integration
A laser source is only one part of the final instrument. Use the model-specific drawing and pinout as the integration baseline, and validate the assembled system including optics, mounting, cabling, supply stability and operating environment.
Protect the output aperture, maintain clear aperture and control alignment with the host optical axis.
The published source specification lists <2 V supply. Confirm start-up, drive current and grounding in the selected datasheet.
Use the model drawing to locate fastening points, keep-out zones and thermal interfaces.
Test the finished host, not just the bare source, for optical performance and safety compliance.
Manufacturing, testing & delivery
Repeatable supply depends on controlled assembly, model-level testing, interface confirmation and protective packing. The exact acceptance plan and documentation are defined for the quoted configuration.
Verify output against the selected 1535 nm source specification.
Measure output energy against the relevant model acceptance value.
Check pulse width and repetition behaviour for the selected operating mode.
Confirm beam alignment and divergence against the product requirement.
Confirm model identity, interface leads, package condition and order-specific documentation.
Separate the source units and protect optical and electrical interfaces for the handling route.
Pre-sales FAQ
These answers provide a practical starting point for source selection and quotation. Exact interfaces, acceptance criteria and drawings are confirmed for the selected model.
Start with the system’s optical link budget, receiver sensitivity, desired signal margin, host-optics transmission, range or sensing requirement and thermal/electrical limits. Higher pulse energy is not automatically the correct answer; the delivered beam, measurement cadence and final system assessment matter together.
The published 1535-LXER040 specification lists 1000 Hz. The 100–500 µJ models listed on this page are specified at 1–10 Hz. Confirm the required operating mode and duty cycle in the selected product datasheet.
Yes. Request the model-specific technical specification, mechanical drawing and available interface documentation during the quotation or sample-evaluation stage. These documents should be used as the design baseline rather than generic category-page values.
It describes the angular spread of the delivered beam. It influences the beam footprint, downstream aperture sizing and alignment tolerance. Host optics may further shape the beam, so calculate the complete optical path and verify it during system testing.
We can evaluate OEM requirements for mechanical interface, electrical connection, optical configuration and programme documentation. Feasibility depends on the requested performance, production volume, validation scope and the final host application.
Provide the target application, required pulse energy or signal margin, operating repetition rate, host optical layout, available space and mass, supply conditions, expected temperature range, expected quantity and target validation date.
No. The source is an OEM component. The final instrument must be assessed in its completed optical, electrical and operating configuration against the applicable product and laser-safety requirements.
Engineering support
Send your pulse-energy target, repetition rate, optical layout, mechanical envelope and operating conditions. We will help identify the most suitable model and the engineering documents needed for evaluation.